《電子技術(shù)應(yīng)用》
您所在的位置:首頁(yè) > 电子元件 > 设计应用 > 大功率IGBT器件内部载流子控制方法综述
大功率IGBT器件内部载流子控制方法综述
2020年电子技术应用第6期
邹 密1,马 奎2
1.贵州大学 大数据与信息工程学院,贵州 贵阳550025; 2.贵州省微纳电子与软件技术重点实验室,贵州 贵阳550025
摘要: 绝缘栅双极晶体管(IGBT)的内部载流子控制方法对器件的导通状态电压降、关断损耗、SOA、热可靠性和瞬态稳定性等器件性能至关重要。已经报道的许多载流子控制方法都侧重于发射极(或阴极)、集电极(或阳极)和漂移区的设计。重点介绍了当前和未来几代IGBT的载流子控制方法。回顾发射极、集电极和漂移区的设计如何影响正向压降和关断能量损耗之间的权衡。最后,总结展望未来大功率IGBT器件内部载流子控制方法的发展趋势。
中圖分類號(hào): TN389
文獻(xiàn)標(biāo)識(shí)碼: A
DOI:10.16157/j.issn.0258-7998.200085
中文引用格式: 鄒密,馬奎. 大功率IGBT器件內(nèi)部載流子控制方法綜述[J].電子技術(shù)應(yīng)用,2020,46(6):21-27.
英文引用格式: Zou Mi,Ma Kui. Survey of internal carrier control methods for high power IGBTs[J]. Application of Electronic Technique,2020,46(6):21-27.
Survey of internal carrier control methods for high power IGBTs
Zou Mi1,Ma Kui2
1.College of Big Data and Information Engineering,Guizhou University,Guiyang 550025,China; 2.Key Laboratory of Micro-Nano-Electronics of Guizhou Province,Guiyang 550025,China
Abstract: Internal carrier control methods for Insulated Gate Bipolar Transistors(IGBTs) are critical for the device performances such as on-state voltage drop, turn-off losses, SOA, thermal reliability and transient ruggedness, etc. Numerous carrier control methods focusing on the design of the emitter(or cathode), collector(or anode), and drift regions have been reported. This paper focuses on the carrier control methods of current and future generations of IGBTs.In particular, the designs of the emitter, collector, and drift regions and how they affects the trade-off between the forward voltage drop and the turn-off energy loss are reviewed. Finally, the development trend of carrier control in high-power IGBT devices is summarized look forward to.
Key words : IGBT; carrier control methods; device performance; turn-off losses; on-state voltage drop

0 引言

    在過(guò)去的三十年,絕緣柵雙極晶體管(Insulated Gate Bipolar Transistors,IGBT)已發(fā)展成為現(xiàn)代功率半導(dǎo)體器件的主力器件之一。和功率MOSFET相比,IGBT有工作電壓高、工作電流大、驅(qū)動(dòng)功率小等優(yōu)點(diǎn),被廣泛應(yīng)用于電機(jī)控制、不間斷電源(UPS)、空調(diào)、機(jī)器人、焊機(jī)和汽車電子等中頻應(yīng)用領(lǐng)域。




論文詳細(xì)內(nèi)容請(qǐng)下載http://m.ihrv.cn/resource/share/2000002835




作者信息:

鄒  密1,馬  奎2

(1.貴州大學(xué) 大數(shù)據(jù)與信息工程學(xué)院,貴州 貴陽(yáng)550025;

2.貴州省微納電子與軟件技術(shù)重點(diǎn)實(shí)驗(yàn)室,貴州 貴陽(yáng)550025)

此內(nèi)容為AET網(wǎng)站原創(chuàng),未經(jīng)授權(quán)禁止轉(zhuǎn)載。

相關(guān)內(nèi)容