中圖分類號(hào)： TN409
文獻(xiàn)標(biāo)識(shí)碼： A
DOI：10.16157/j.issn.0258-7998.222712
中文引用格式： 周永忠，洪晟，姜義初，等. 中央處理器安全測試與自修復(fù)技術(shù)研究[J].電子技術(shù)應(yīng)用，2022，48(9)：39-43，49.
英文引用格式： Zhou Yongzhong，Hong Sheng，Jiang Yichu，et al. Research on integrated circuit safety test and repair technology[J]. Application of Electronic Technique，2022，48(9)：39-43，49.

Research on integrated circuit safety test and repair technology

Abstract： Central processing unit(CPU) plays an important role in industrial control field. Its normal operation is an important security guarantee for industrial. This paper mainly studies the security test and self-repair technology of CPU. From fault injection，fault testing to self-healing，this paper compares and summarizes the related safety technologies, including hardware and software fault injection technology, scan chain, built-in self-testing, TSV and other fault testing methods, as well as alternative repair and fault-tolerant self-healing technologies. Finally, the CPU security cooperation model is proposed, and the basic principles and innovation points of each technology are summarized so as to provide safety reference for the development of CPU fault handling technology in the future, reduce cost and energy consumption while ensuring safety and performance, and help industrial control equipment operate reliably and stably.

Key words : CPU；integrated circuit；fault injection；safety test；self-repair；safety-cooperation model