中圖分類號(hào)：TP18；TN40 文獻(xiàn)標(biāo)志碼：A DOI: 10.16157/j.issn.0258-7998.233806
中文引用格式： 張倩. 集成電路產(chǎn)業(yè)的多源數(shù)據(jù)融合前沿識(shí)別研究[J]. 電子技術(shù)應(yīng)用，2023，49(10)：35-39.
英文引用格式： Zhang Qian. Research on frontier identification of multi-source data fusion in the integrated circuit industry[J]. Application of Electronic Technique，2023，49(10)：35-39.

Research on frontier identification of multi-source data fusion in the integrated circuit industry

Abstract： In the era of big data, accurate and timely identification of research frontiers is particularly important for the positioning of science and technology strategy and the deployment of scientific research direction, which can provide more comprehensive reference and basis for decision-making. The self-developed multi-source data fusion analysis method was used to conduct data mining and denoising from global journal papers, conference papers, patent literature, science and technology news, research reports, science and technology policies, standards and other data. The list of current research frontiers and technologies in the field of IC was effectively identified. At present, the research hotspot and development direction of global integrated circuit field are concentrated on semiconductor manufacturing equipment and high process manufacturing technology, and the focus is on high-end chips, power devices, sensors, memory and third-generation semiconductor related products. The localization of China's semiconductor industry is imminent. The results of frontier identification provide valuable decision support and reference for the government and enterprises.

Key words : research frontier；multi source fusion；knowledge discovery；integrated circuit