中圖分類(lèi)號(hào)：TN721；TN92 文獻(xiàn)標(biāo)志碼：A DOI: 10.16157/j.issn.0258-7998.246155
中文引用格式： 徐豪. 大功率射頻放大電路過(guò)沖損傷的研究與設(shè)計(jì)[J]. 電子技術(shù)應(yīng)用，2025，51(6)：105-109.
英文引用格式： Xu Hao. Research and design of transient pulse damage in high-power RF amplifier[J]. Application of Electronic Technique，2025，51(6)：105-109.

Research and design of transient pulse damage in high-power RF amplifier

Abstract： Due to a variety of imperceptible design defects，high-power RF amplifiers are prone to transient pulse, which has a significant impact on the reliability and service life of the hardware，and seriously interfere with the quality of work. Aiming at the transient pulse damage problems of high-power RF amplifiers，this paper focuses on transceiver timing control，frequency control, ALC response. The influence of transceiver timing control，frequency control and ALC response on the reliability and service life of high-power RF amplifiers is discussed. The design principles of high-power RF amplifiers are put forward. Typical applications and verifications show that the correct and reliable transceiver timing control，frequency control and ALC response can effectively solve the problem of transient pulse damage and improve the reliability and service life of the high-power RF amplifiers.

Key words : high-power；RF amplification circuit；stopping or running sequence control；frequency control；ALC response